Upphandlingar: Tekniska Högskolan i Jönköping AB

5 arkiverade upphandlingar

Historiskt sett har leverantörerna till Tekniska Högskolan i Jönköping AB varit MP Engineering AB och MTS Systems Norden AB.

Nyligen genomförda upphandlingar av Tekniska Högskolan i Jönköping AB

2026-03-18   High-Pressure Die Casting Cell with Supporting Equipment (Tekniska Högskolan i Jönköping AB)
JUTEC - Jönköping University Technology Equipment Center, a recently established company under Jönköping University invites you to submit a tender for a High-Pressure Die Casting (HPDC) Cell with supporting equipment. (JUTEC is a working name and yet to be confirmed.) Visa upphandlingen »
2023-04-03   FESEM 2023 (Tekniska Högskolan i Jönköping AB)
The Contract regulates JTH’s purchase of one high-resolution Field Emission Scanning Electron Microscope (“FESEM”) with integrated parts and functions, together referred to as the “System”. Also included in the scope of the Contract: delivery, assembly, installation, and configuration of the System to full operational status ready for use, training of JTH personnel, technical support, preventive maintenance, corrective service, upgrades and updates of the System. And options as per description. Visa upphandlingen »
2017-06-15   Fatigue test equipment (Tekniska Högskolan i Jönköping AB)
The scope of this procurement is to sign a contract with one supplier for the supply of a comprehensive system for fatigue testing of primarily metallic samples and components. Visa upphandlingen »
2017-04-13   3D-printer (Tekniska Högskolan i Jönköping AB)
The scope of this procurement is to sign a contract with one supplier for the supply of a laser based metal powder bed based 3D metal printer. Visa upphandlingen »
2015-05-07   High-resolution Field Emission Scanning Electron Microscopy with FIB; and Broad Argon Beam milling system (Tekniska Högskolan i Jönköping AB)
This procurement is divided into 2 separate tender areas A and B; the supply of a high-resolution Field Emission Scanning Electron Microscope (FESEM, also commonly abbreviated as FEG-SEM or FE-SEM) with attached Focus Ion Beam capability (FIB) as specified in the attached documentation, and the supply of a Broad Argon Ion Beam milling system with the capability of conductive coating as specified in the attached documentation. Visa upphandlingen »