High-resolution Field Emission Scanning Electron Microscopy with FIB; and Broad Argon Beam milling system
This procurement is divided into 2 separate tender areas A and B; the supply of a high-resolution Field Emission Scanning Electron Microscope (FESEM, also commonly abbreviated as FEG-SEM or FE-SEM) with attached Focus Ion Beam capability (FIB) as specified in the attached documentation, and the supply of a Broad Argon Ion Beam milling system with the capability of conductive coating as specified in the attached documentation.
Sista ansökningsdag
Tidsfristen för mottagande av anbud var 2015-06-17.
Upphandlingen offentliggjordes den 2015-05-07.
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Upphandlingshistorik
| Datum |
Dokument |
| 2015-05-07
|
Meddelande om upphandling
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