Advanced analytical electron microscopes for soft microscopy
Chalmers is to acquire state-of-the-art electron microscopes including a high-resolution transmission electron microscope (TEM) with attachments, a scanning electron microscope (SEM) with attachments and a combined focused ion beam (FIB) SEM instruments with attachments. Of particular importance is the high-resolution performance at low acceleration voltages and also the ability to study liquid containing materials and hybrid materials including hard and soft matter.
Sista ansökningsdag
Tidsfristen för mottagande av anbud var 2015-10-19.
Upphandlingen offentliggjordes den 2015-09-18.
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Upphandlingshistorik
Datum |
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2015-09-18
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Meddelande om upphandling
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