Ion Mill and tools for TEM specimen preparation
It is expected to procure a set of tools for the preparation of site specific and transmission electron microscopy (TEM) specimens from solid materials. This set should include instruments for the preparation of thin-foil and section specimens from as-cut up to 1 mm thick samples by ultrasonic cutting/mechanical punching, mechanical parallel-surface and dimple grinding to a size suitable for Ion Milling and final precision Ion Milling to electron transparency. An example set of instruments may include (a) ultrasonic cutter, (b) mechanical punch for disks 3 mm in diameter, (c) specimen holder and other tools for precision parallel-surface grinding, (d) dimple grinder, and (e) ion mill.
Sista ansökningsdag
Tidsfristen för mottagande av anbud var 2017-07-18.
Upphandlingen offentliggjordes den 2017-06-16.
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Upphandlingshistorik
| Datum |
Dokument |
| 2017-06-16
|
Meddelande om upphandling
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