Upphandlingar: Mörkfältsmikroskop och svepsondmikroskop

4 arkiverade upphandlingar

Mörkfältsmikroskop och svepsondmikroskop har anskaffats av organisationer som t.ex Lunds universitet och Kungliga Tekniska Högskolan.
Historiskt sett har leverantörerna inom detta område varit Leiden Probe Microscopy B.V. och MPI Corporation.

Nyligen genomförda upphandlingar av mörkfältsmikroskop och svepsondmikroskop i Sverige

2020-04-03   Scanning Probe Microscope STM System (Kungliga Tekniska Högskolan)
KTH wants to purchase a bolt-on Scanning Tunnelling Microscope (STM) system which will be added to an Ultra-High Vacuum (UHV) — surface science instrument. The purpose of procurement and the aim of the tender: KTH wants to purchase a bolt-on Scanning Tunnelling Microscope system (hereafter called STM system) which will be added to an Ultra-High Vacuum (UHV) — surface science instrument. The STM system will be part of a molecular beam surface scattering instrument being built to investigate the effects of … Visa upphandlingen »
Nämnda leverantörer: Leiden Probe Microscopy B.V.
2019-01-09   Semi-Automatic Probe Station for DC, RF, and Millimetre-Wave Measurements (Lunds universitet)
The procurement consists of the purchase, delivery, and installation of a semi-automatic probe station. This will allow more effective characterization of arrays of DC components or more precise RF/millimetre wave calibration and parasitics deembedding, by automatic stepping of the probe station sample chuck. The probe station and its components must be compatible with the herein specified existing components and measurement instruments already available at Lund University. Visa upphandlingen »
Nämnda leverantörer: MPI Corporation
2018-06-13   Probe station, semi automatic (Lunds universitet)
The purchase, delivery, and installation of a Semi-automatic probe station with at least two (2) years warranty. This equipment should be adapted to a multitude of on-wafer characterization scenarios and has the capability of precise and repeatable automatic component-to-component probe placement. This will allow more effective characterization of arrays of DC components or more precise RF / millimetre wave calibration and parasitics deembedding, by automatic stepping of the probe station sample chuck. Visa upphandlingen »
2015-03-02   Scanning probe microscope for advanced light sources (Lunds universitet)
Scanning Probe Microscope for advanced light sources. Visa upphandlingen »